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arXiv 0709.4156cond-mat.mtrl-sci
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SiO2上石墨烯掺杂区的拉曼成像

Raman imaging of doping domains in graphene on SiO2

C. Stampfer, L. Wirtz, A. Jungen, D. Graf, F. Molitor, C. Hierold, K. Ensslin

摘要:

我们提出了单层石墨烯片的G和2D线的空间分辨拉曼图像。G和2D线的空间波动是相关的,因此被证明是附属于本地掺杂域。我们研究了二维谱线的位置--这是识别单层石墨烯的最重要的拉曼峰--作为电荷高达|n| ~4 10^12 cm^-2的函数。与相对于电子和空穴掺杂表现出强且对称的硬化的G线相反,2D线对于低掺杂表现出弱且略微不对称的硬化。此外,与G线相比,2D线的线宽与掺杂无关,使得该量成为用于识别单层石墨烯的可靠量度。

英文摘要:

We present spatially resolved Raman images of the G and 2D lines of single-layer graphene flakes. The spatial fluctuations of G and 2D lines are correlated and are thus shown to be affiliated with local doping domains. We investigate the position of the 2D line -- the most significant Raman peak to identify single-layer graphene -- as a function of charging up to |n|~4 10^12 cm^-2. Contrary to the G line which exhibits a strong and symmetric stiffening with respect to electron and hole-doping, the 2D line shows a weak and slightly asymmetric stiffening for low doping. Additionally, the line width of the 2D line is, in contrast to the G line, doping-independent making this quantity a reliable measure for identifying single-layer graphene.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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