单轴应力下石墨烯的拉曼光谱：声子软化和晶体取向的确定
Raman Spectroscopy of Graphene under Uniaxial Stress: Phonon Softening and Determination of the Crystallographic Orientation
摘要：
本文系统地研究了单轴拉伸应力作用下石墨烯单分子膜中光学声子的拉曼光谱。G带和2D带都表现出显著的红移。由于应变引起的对称性破缺，G带分裂成两个不同的子带（G+，G-）。来自G+和G-带的拉曼散射显示出独特的偏振依赖性，其反映了应力轴与下面的石墨烯晶体轴之间的角度。因此，偏振拉曼光谱构成了用于确定石墨烯的晶体取向的纯光学方法。
英文摘要：
We present a systematic study of the Raman spectra of optical phonons in graphene monolayers under tunable uniaxial tensile stress. Both the G and 2D bands exhibit significant red shifts. The G band splits into two distinct sub-bands (G+, G-) because of the strain-induced symmetry breaking. Raman scattering from the G+ and G- bands shows a distinctive polarization dependence that reflects the angle between the axis of the stress and the underlying graphene crystal axes. Polarized Raman spectroscopy therefore constitutes a purely optical method for the determination of the crystallographic orientation of graphene.
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