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arXiv 1702.07534cond-mat.mtrl-sci
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非侵入式扫描拉曼光谱和层析成像技术表征石墨烯膜

Non-invasive Scanning Raman Spectroscopy and Tomography for Graphene Membrane Characterization

Stefan Wagner, Thomas Dieing, Alba Centeno, Amaia Zurutuza, Anderson D. Smith, Mikael Östling, Satender Kataria, Max C. Lemme

摘要:

石墨烯具有非凡的机械和电子性能,使其成为基于膜的纳米机电系统(NEMS)的有前途的材料。在这里,化学气相沉积的石墨烯被转移到目标衬底上,将其悬浮在空腔和沟槽上,用于压力传感器应用。这种器件的开发需要合适的计量方法,即,大规模的表征技术,以确认和分析成功的石墨烯转移与完整的悬浮石墨烯膜。我们提出了快速和非侵入性的拉曼光谱映射来区分独立和衬底支撑的石墨烯,利用不同的应变和掺杂水平。该技术被扩展到结合二维区域扫描与截面拉曼光谱,导致基于膜的石墨烯NEMS的三维拉曼层析成像。拉曼层析成像在线监测的潜力进一步证明了与自动数据分析的方法,以空间上解决微米级集成器件,包括独立和衬底支撑的石墨烯的材料成分。拉曼层析成像可以应用于由其他二维材料以及硅微和纳米机电系统组成的设备。

英文摘要:

Graphene has extraordinary mechanical and electronic properties, making it a promising material for membrane based nanoelectromechanical systems (NEMS). Here, chemical-vapor-deposited graphene is transferred onto target substrates to suspend it over cavities and trenches for pressure-sensor applications. The development of such devices requires suitable metrology methods, i.e., large-scale characterization techniques, to confirm and analyze successful graphene transfer with intact suspended graphene membranes. We propose fast and noninvasive Raman spectroscopy mapping to distinguish between freestanding and substrate-supported graphene, utilizing the different strain and doping levels. The technique is expanded to combine two-dimensional area scans with cross-sectional Raman spectroscopy, resulting in three-dimensional Raman tomography of membrane-based graphene NEMS. The potential of Raman tomography for in-line monitoring is further demonstrated with a methodology for automated data analysis to spatially resolve the material composition in micrometer-scale integrated devices, including free-standing and substrate-supported graphene. Raman tomography may be applied to devices composed of other two-dimensional materials as well as silicon micro- and nanoelectromechanical systems.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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