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arXiv 2104.06370cond-mat.mes-hallcond-mat.mtrl-sci
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中间角度下扭曲双层石墨烯中扭曲角变化的拉曼成像

Raman imaging of twist angle variations in twisted bilayer graphene at intermediate angles

A. Schäpers, J. Sonntag, L. Valerius, B. Pestka, J. Strasdas, K. Watanabe, T. Taniguchi, L. Wirtz, M. Morgenstern, B. Beschoten, R. J. Dolleman, C. Stampfer

摘要:

由于出现了意想不到的材料性能,具有明确定义的各层晶格之间的扭转角的范德华层状材料引起了越来越多的关注。由于许多特性关键地取决于确切的扭转角及其空间均匀性,因此需要局部扭转角的快速且非侵入性的表征技术,优选地在堆叠之后立即应用。我们证明,当使用绿色激发激光时,可以利用共焦拉曼光谱在空间上映射堆叠双层石墨烯中的扭转角为6.5°至8°。扭转角可以直接从横向声学(TA)声子模的莫尔超晶格激活拉曼散射过程中提取。此外,我们表明,TA拉曼峰的宽度包含有价值的信息的空间扭曲角变化的长度尺度下的激光光斑尺寸为~ 500 nm。

英文摘要:

Van der Waals layered materials with well-defined twist angles between the crystal lattices of individual layers have attracted increasing attention due to the emergence of unexpected material properties. As many properties critically depend on the exact twist angle and its spatial homogeneity, there is a need for a fast and non-invasive characterization technique of the local twist angle, to be applied preferably right after stacking. We demonstrate that confocal Raman spectroscopy can be utilized to spatially map the twist angle in stacked bilayer graphene for angles between 6.5° and 8° when using a green excitation laser. The twist angles can directly be extracted from the moiré superlattice-activated Raman scattering process of the transverse acoustic (TA) phonon mode. Furthermore, we show that the width of the TA Raman peak contains valuable information on spatial twist angle variations on length scales below the laser spot size of ~ 500 nm.

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