arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 0807.3211cond-mat.mtrl-scicond-mat.mes-hall

Thickness Estimation of Epitaxial Graphene on SiC using Attenuation of Substrate Raman Intensity

Shriram Shivaraman, M. V. S. Chandrashekhar, John J. Boeckl, Michael G. Spencer

英文摘要:

A simple, non-invasive method using Raman spectroscopy for the estimation of the thickness of graphene layers grown epitaxially on silicon carbide (SiC) is presented, enabling simultaneous determination of thickness, grain size and disorder using the spectra. The attenuation of the substrate Raman signal due to the graphene overlayer is found to be dependent on the graphene film thickness deduced from X-ray photoelectron spectroscopy and transmission electron microscopy of the surfaces. We explain this dependence using an absorbing overlayer model. This method can be used for mapping graphene thickness over a region and is capable of estimating thickness of multilayer graphene films beyond that possible by XPS and Auger electron spectroscopy (AES).

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑