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arXiv 1406.4033cond-mat.mtrl-scicond-mat.mes-hallcs.ETcs.ITmath.IT
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阻变存储器中的简并阻变与超高密度存储

Degenerate Resistive Switching and Ultrahigh Density Storage in Resistive Memory

Andrew J. Lohn, Patrick R. Mickel, Conrad D. James, Matthew J. Marinella

摘要:

我们表明,在钽氧化物电阻存储器,激活功率提供了一个多层次的变量,可以设置和读取的电阻分开的信息存储。这两个状态变量(电阻和激活功率)可以通过两个步骤进行精确控制:(1)通过部分降低电阻来选择可能的激活功率状态,然后(2)随后的电阻部分增加指定电阻状态和最终的激活功率状态。我们表明,这些状态可以精确地写入和读取电,使这种方法可能适用于超高密度存储器。我们提供了一个理论解释的信息存储和检索从激活功率和实验证明在第三个维度的信息存储有关的激活功率与电阻的变化。

英文摘要:

We show that, in tantalum oxide resistive memories, activation power provides a multi-level variable for information storage that can be set and read separately from the resistance. These two state variables (resistance and activation power) can be precisely controlled in two steps: (1) the possible activation power states are selected by partially reducing resistance, then (2) a subsequent partial increase in resistance specifies the resistance state and the final activation power state. We show that these states can be precisely written and read electrically, making this approach potentially amenable for ultra-high density memories. We provide a theoretical explanation for information storage and retrieval from activation power and experimentally demonstrate information storage in a third dimension related to the change in activation power with resistance.

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