具有自顺应效应的Al/CoFe2O4/FTO器件中的无电铸控制双极电阻开关
Electroforming Free Controlled Bipolar Resistive Switching in Al/CoFe2O4/FTO device with Self-Compliance Effect
摘要：
利用Al（铝）/CoFe 2 O 4/FTO（掺氟氧化锡）器件在纳米结构CoFe 2 O 4薄膜中观察到可控双极阻变（BRS）。所制造的器件示出了无电铸的均匀BRS，其具有两个清楚区分的且稳定的电阻状态，而没有任何顺从电流（CC）的施加，其中高电阻状态（HRS）和低电阻状态（LRS）的电阻比> 102。小的开关电压（< 1伏）和两种电阻状态下的较低电流证实了低功耗器件的制造。在LRS中，导电机制被发现是欧姆性质，而高电阻状态（HRS/OFF状态）是由空间电荷限制的导电机制，这表明存在的界面层与不完善的微观结构附近的顶部Al/CFO界面。该器件表现出非易失性行为，具有良好的耐久性能、可接受的电阻比、由于稳定的、较少随机的细丝形成/断裂而导致的均匀的电阻切换以及通过选择不同的停止电压对电阻切换性能的控制，这使得该器件适合于其在未来的非易失性电阻随机存取存储器（ReRAM）中的应用。
英文摘要：
Controlled bipolar resistive switching (BRS) has been observed in nanostructured CoFe2O4 films using Al(aluminum)/CoFe2O4/FTO(fluorine-doped tin oxide) device. The fabricated device shows electroforming-free uniform BRS with two clearly distinguished and stable resistance states without any application of compliance current (CC), with a resistance ratio of high resistance state (HRS) and low resistance state (LRS) > 102. Small switching voltage (< 1 volt) and lower current in both the resistance states confirms the fabrication of low power consumption device. In the LRS, the conduction mechanism was found to be of Ohmic in nature, while the high-resistance state (HRS/OFF state) was governed by space charge-limited conduction mechanism, which indicates the presence of an interfacial layer with imperfect microstructure near the top Al/CFO interface. The device shows nonvolatile behavior with good endurance properties, acceptable resistance ratio, uniform resistive switching due to stable, less random filament formation/rupture and a control over the resistive switching properties by choosing different stop voltages, which makes the device suitable for its application in future nonvolatile resistive random access memory (ReRAM).
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