arXivDaily arXiv每日学术速递 周一至周五更新
arXiv周末暂无论文更新,休息一下吧,周末愉快~~
arXiv 0906.5100cond-mat.mes-hallcond-mat.mtrl-sci
收藏

SiO2衬底上纳米间隙系统的电阻开关

Resistive switching in nanogap systems on SiO2 substrates

Jun Yao, Lin Zhong, Zengxing Zhang, Tao He, Zhong Jin, Patrick J. Wheeler, Douglas Natelson, James M. Tour

摘要:

电压控制的电阻开关在SiO2衬底上的各种间隙系统中进行了演示。纳米尺寸的间隙是通过不同的方法使用不同的材料,包括金属,半导体和金属非金属。通过使用多壁碳纳米管和单壁碳纳米管,开关位点进一步减少。所有间隙系统中的开关具有相同的特征。这种独立的开关上的材料组成的电极,伴随着可观察到的损坏的SiO2基板在间隙区域,bespeaks从击穿后SiO2的本征开关。它呼吁谨慎研究氧化物衬底上的纳米系统中的电阻开关,因为氧化物击穿外在的纳米系统可以模仿电阻开关。同时,高的开/关比(10 E5),快速的开关时间(2 μ s,测试极限),持久的循环显示出有前途的记忆性能。观察到的中间态揭示了导电的本质。

英文摘要:

Voltage-controlled resistive switching is demonstrated in various gap systems on SiO2 substrate. The nanosized gaps are made by different means using different materials including metal, semiconductor, and metallic nonmetal. The switching site is further reduced by using multi-walled carbon nanotubes and single-walled carbon nanotubes. The switching in all the gap systems shares the same characteristics. This independence of switching on the material compositions of the electrodes, accompanied by observable damage to the SiO2 substrate at the gap region, bespeaks the intrinsic switching from post-breakdown SiO2. It calls for caution when studying resistive switching in nanosystems on oxide substrates, since oxide breakdown extrinsic to the nanosystem can mimic resistive switching. Meanwhile, the high ON/OFF ratio (10E5), fast switching time (2 us, test limit), durable cycles demonstrated show promising memory properties. The intermediate states observed reveal the filamentary conduction nature.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑