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arXiv physics/0409049physics.ins-dethep-ex
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辐照硅中的类型反转:一半的事实

Type inversion in irradiated silicon: a half truth

M. Swartz, D. Bortoletto, V. Chiochia, L. Cremaldi, S. Cucciarelli, A. Dorokhov, M. Konecki, K. Prokofiev, C. Regenfus, T. Rohe, D. A. Sanders, S. Son, T. Speer

摘要:

电荷收集测量上进行了严重照射的p-喷雾dofz像素传感器与掠射角强子束提供了一个灵敏的测定内的检测器的电场。的数据进行了比较与一个完整的电荷传输模拟的传感器,其中包括信号捕获和电荷感应效应。线性变化的电场的基础上,一个恒定的类型反转的有效掺杂密度的标准图片是不一致的数据。在ISE TCAD软件中实现的双阱双结模型可以被调整以产生双峰电场,其在两个不同的注量下合理地描述数据。模拟的磁场与先前基于瞬态电流技术的测定略有不同。该模型还可以解释在数据中观察到的信号捕获水平。

英文摘要:

Charge collection measurements performed on heavily irradiated p-spray dofz pixel sensors with a grazing angle hadron beam provide a sensitive determination of the electric field within the detectors. The data are compared with a complete charge transport simulation of the sensor which includes signal trapping and charge induction effects. A linearly varying electric field based upon the standard picture of a constant type-inverted effective doping density is inconsistent with the data. A two-trap double junction model implemented in ISE TCAD software can be tuned to produce a doubly-peaked electric field which describes the data reasonably well at two different fluences. The modeled field differs somewhat from previous determinations based upon the transient current technique. The model can also account for the level of signal trapping observed in the data.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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