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arXiv 1409.8487physics.ins-dethep-ex
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辐照硅条探测器电荷收集效率的模拟

Charge Collection Efficiency Simulations of Irradiated Silicon Strip Detectors

T. Peltola

摘要:

在CERN世界上最大的粒子物理加速器LHC计划进行的高亮度升级期间,安装在CMS实验顶点和跟踪部分的位置敏感硅探测器将面临比现有系统设计更强的辐射环境。因此,为了将跟踪器升级到所需的性能水平,已经进行了全面的测量和模拟研究。通过监测辐照硅探测器的电荷收集效率(CCE),可以获得辐照硅探测器性能的基本信息。从CCE随注量的演变,可以直接观察辐射感生缺陷对探测器收集通过穿越最小电离粒子(mip)产生的载流子的能力的影响。本文给出了辐照硅条探测器条间CCE和CCE损耗的数值模拟。基于Synopsys Sentaurus TCAD框架的模拟在辐照之前和之后针对n-on-p传感器进行高达$1.5\times10^{15}$ $\textrm{n}_{\textrm{eq}}$ cm $^{-2}$的注量。质子辐照模拟采用二能级和非均匀三能级缺陷模型,中子辐照模拟采用二能级模型。的结果一起提出的测量条探测器照射不同的粒子和注量,并显示出相当大的一致性CCE及其位置依赖性。

英文摘要:

During the scheduled high luminosity upgrade of LHC, the world's largest particle physics accelerator at CERN, the position sensitive silicon detectors installed in the vertex and tracking part of the CMS experiment will face more intense radiation environment than the present system was designed for. Thus, to upgrade the tracker to required performance level, comprehensive measurements and simulations studies have already been carried out. Essential information of the performance of an irradiated silicon detector is obtained by monitoring its charge collection efficiency (CCE). From the evolution of CCE with fluence, it is possible to directly observe the effect of the radiation induced defects to the ability of the detector to collect charge carriers generated by traversing minimum ionizing particles (mip). In this paper the numerically simulated CCE and CCE loss between the strips of irradiated silicon strip detectors are presented. The simulations based on Synopsys Sentaurus TCAD framework were performed before and after irradiation for fluences up to $1.5\times10^{15}$ $\textrm{n}_{\textrm{eq}}$cm$^{-2}$ for the n-on-p sensors. A two level and non-uniform three level defect models were applied for the proton irradiation simulations and two level model for neutrons. The results are presented together with the measurements of strip detectors irradiated by different particles and fluences and show considerable agreement for both CCE and its position dependency.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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