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arXiv physics/0411205physics.ins-det
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AToM硅顶点跟踪器前端芯片辐照后的抗辐照性能研究

Study of the Radiation Hardness of Irradiated AToM Front-End Chips of the BaBar Silicon Vertex Tracker

G. Calderini, S. Bettarini, M. Bondioli, L. Bosisio, S. Dittongo, F. Forti, M. A. Giorgi

摘要:

用60Co源的光子和0.9GeV电子辐照BaBar硅顶点跟踪器的AToM芯片,研究了其抗辐照强度。放大器噪声的增加和增益的降低被测量为所施加的容性负载和吸收剂量的函数。采用不同的束流强度,研究了不同剂量率对AToM辐射损伤的影响。芯片的数字功能已经测试了高达5.5兆拉德的60 Co光子和9兆拉德的0.9 GeV电子的剂量。此外,在用电子的测试中已经观察到被照射通道的基座移位,但在用光子的照射中不存在。这种效应定性地再现了自2002年以来在安装的BaBar Silicon Vertex Tracker的前端电子设备中观察到的行为。在对芯片布局进行了一些调查之后,这种特殊的行为可能与AToM的一个明确识别的组件中的辐射损伤有关。辐射测试的结果,并用于推断安装的探测器在未来几年的性能和寿命。

英文摘要:

The radiation hardness of the AToM chips of the BaBar Silicon Vertex Tracker has been investigated by means of irradiations with photons from a 60Co source and 0.9 GeV electrons. The increase in noise and the decrease in gain of the amplifier have been measured as a function of the applied capacitive load and the absorbed dose. Different beam intensities have been used to study the effect of different dose rates to the AToM radiation damage. The chip digital functionalities have been tested up to a dose of 5.5 Mrads for the 60Co photons and 9 Mrads for the 0.9 GeV electrons. In addition a pedestal shift for the irradiated channels has been observed in the test with electrons but is not present in the irradiation with photons. This effect reproduces qualitatively the behavior observed since 2002 in the front-end electronics of the installed BaBar Silicon Vertex Tracker. After some investigation of the chip layout, this peculiar behavior could be associated to radiation damage in a well-identified component of the AToM. The results of the radiation tests are presented and used to extrapolate the performance and lifetime of the installed detector in the next few years.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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