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arXiv 0809.3823physics.ins-det
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BABAR硅顶点跟踪探测器的局部对准

Local Alignment of the BABAR Silicon Vertex Tracking Detector

D. N. Brown, A. V. Gritsan, Z. J. Guo, D. Roberts

摘要:

BABAR硅顶点跟踪器(SVT)是一个五层双面硅探测器,旨在提供主轨迹位置和方向的精确测量,并完全重建斯坦福直线加速器中心PEP-II非对称对撞机的e+e碰撞产生的低动量轨迹。本文介绍了设计,实施,性能和验证的本地对准程序,用于确定340 SVT晶片的相对位置和方向。该过程使用现场实验数据和补充实验室工作台测量的调谐组合来控制系统失真。通过最小化使用每个晶片的这些数据计算的卡方来确定晶片位置和取向,迭代以考虑晶片之间的相关性。测量和应用的硅晶片的非平面失真的校正。在特殊的控制样本中,对相关物理变量的残余失调的净效应进行了评估。利用1999年11月至2008年4月期间收集的BABAR数据样本,对SVT稳定性进行了研究。

英文摘要:

The BABAR Silicon Vertex Tracker (SVT) is a five-layer double-sided silicon detector designed to provide precise measurements of the position and direction of primary tracks, and to fully reconstruct low-momentum tracks produced in e+e- collisions at the PEP-II asymmetric collider at Stanford Linear Accelerator Center. This paper describes the design, implementation, performance, and validation of the local alignment procedure used to determine the relative positions and orientations of the 340 SVT wafers. This procedure uses a tuned mix of in-situ experimental data and complementary lab-bench measurements to control systematic distortions. Wafer positions and orientations are determined by minimizing a chisquared computed using these data for each wafer individually, iterating to account for between-wafer correlations. A correction for aplanar distortions of the silicon wafers is measured and applied. The net effect of residual mis-alignments on relevant physical variables is evaluated in special control samples. The BABAR data-sample collected between November 1999 and April 2008 is used in the study of the SVT stability.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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