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arXiv 0901.4903physics.ins-dethep-ex
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小间距硅条传感器分辨率的研究

Resolution Studies on Silicon Strip Sensors with fine Pitch

S. Haensel, T. Bergauer, Z. Dolezal, M. Dragicevic, Z. Drasal, M. Friedl, J. Hrubec, C. Irmler, W. Kiesenhofer, M. Krammer, P. Kvasnicka

摘要:

在2008年6月,单面硅条传感器与50 $μ$ m读出间距进行了测试,在高能π介子束在SPS在欧洲核子研究中心。该测试的目的是通过改变条带宽度和中间条带的数量来评价特征检测器特性。的实验装置和空间分辨率的第一个结果进行了讨论。

英文摘要:

In June 2008 single-sided silicon strip sensors with 50 $μ$m readout pitch were tested in a highly energetic pion beam at the SPS at CERN. The purpose of the test was to evaluate characteristic detector properties by varying the strip width and the number of intermediate strips. The experimental setup and first results for the spatial resolution are discussed.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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