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arXiv 1401.2887physics.ins-dethep-ex
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具有和不具有有源边缘的强辐照N-in-p薄平面像素传感器

Heavily Irradiated N-in-p Thin Planar Pixel Sensors with and without Active Edges

S. Terzo, L. Andricek, A. Macchiolo, H. G. Moser, R. Nisius, R. H. Richter, P. Weigell

摘要:

我们提出的硅像素模块采用n在p平面传感器的有源厚度为150 $\mathrmμ$ m,在MPP/HLL生产的,和100-200 $\mathrmμ$ m薄的有源边缘传感器设备,在芬兰VTT生产的表征的结果。这些薄传感器被设计为在HL-LHC上运行的ATLAS像素探测器升级的候选者,因为它们确保了高通量下的辐射硬度。它们与ATLAS FE-I3和FE-I4读出芯片互连。此外,n-in-p技术仅需要单侧处理,因此它是目前在LHC实验中采用的n-in-n像素技术的具有成本效益的替代方案。在CERN SpS和汉堡DESY对这些装置进行了高精度的束流试验测量。我们研究了这些传感器在不同的偏置电压和不同的光束入射角的行为,最大的一个预期的新的插入B层的ATLAS和HL-LHC探测器。与150 $\mathrmμ$米薄传感器,组装新的ATLAS FE-I4芯片和照射高达4 $\times$ 10 $^{15}\mathrm{n}_{\mathrm{eq}}/\mathrm{cm}^2$的注量,获得的结果表明,他们是很好的候选人更大的半径的硅像素跟踪器的升级的ATLAS探测器在HL-LHC。此外,VTT器件的有源边缘技术最大限度地提高了传感器的有效面积,并减少了材料预算,以满足最内层的要求。VTT模块的边缘像素性能进行了研究,在束流测试实验和分析后,辐照高达5 $\times$ 10 $^{15}\mathrm{n}_{\mathrm{eq}}/\mathrm{cm}^2$的通量已在实验室中使用放射源进行。

英文摘要:

We present the results of the characterization of silicon pixel modules employing n-in-p planar sensors with an active thickness of 150 $\mathrmμ$m, produced at MPP/HLL, and 100-200 $\mathrmμ$m thin active edge sensor devices, produced at VTT in Finland. These thin sensors are designed as candidates for the ATLAS pixel detector upgrade to be operated at the HL-LHC, as they ensure radiation hardness at high fluences. They are interconnected to the ATLAS FE-I3 and FE-I4 read-out chips. Moreover, the n-in-p technology only requires a single side processing and thereby it is a cost-effective alternative to the n-in-n pixel technology presently employed in the LHC experiments. High precision beam test measurements of the hit efficiency have been performed on these devices both at the CERN SpS and at DESY, Hamburg. We studied the behavior of these sensors at different bias voltages and different beam incident angles up to the maximum one expected for the new Insertable B-Layer of ATLAS and for HL-LHC detectors. Results obtained with 150 $\mathrmμ$m thin sensors, assembled with the new ATLAS FE-I4 chip and irradiated up to a fluence of 4$\times$10$^{15}\mathrm{n}_{\mathrm{eq}}/\mathrm{cm}^2$, show that they are excellent candidates for larger radii of the silicon pixel tracker in the upgrade of the ATLAS detector at HL-LHC. In addition, the active edge technology of the VTT devices maximizes the active area of the sensor and reduces the material budget to suit the requirements for the innermost layers. The edge pixel performance of VTT modules has been investigated at beam test experiments and the analysis after irradiation up to a fluence of 5$\times$10$^{15}\mathrm{n}_{\mathrm{eq}}/\mathrm{cm}^2$ has been performed using radioactive sources in the laboratory.

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