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arXiv 2101.07071cond-mat.mtrl-sci
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非晶衬底扩散晶格激发限制的金属薄膜热弛豫

Thermal relaxation in metal films limited by diffuson lattice excitations of amorphous substrates

E. M. Baeva, N. A. Titova, L. Veyrat, B. Sacépé, A. V. Semenov, G. N. Goltsman, A. I. Kardakova, V. S. Khrapai

摘要:

在这里,我们研究的作用,非晶绝缘基板的热弛豫在薄NbN,InO $_x$,和Au/Ni薄膜在5 K以上的温度。所研究的样品是由金属桥上的非晶绝缘层躺在或悬浮在晶体基板。使用噪声测温法测量薄膜的电子温度$T_e$作为单位面积$P_{2D}$的焦耳功率的函数。在所有样品中,我们观察到$P_{2D}\propto T_e^n$与指数$n\simeq 2$的依赖关系,这与电子-声子耦合和Kapitza热阻都不一致。在悬浮样品中,$P_{2D}(T_e)$对非晶绝缘层的长度的功能依赖性与热导率的线性$T$依赖性一致,这与声子平均自由程小于主导声子波长的晶格激发(扩散子)有关。我们的研究结果是重要的理解嵌入在非晶半导体器件的操作。

英文摘要:

Here we examine the role of the amorphous insulating substrate in the thermal relaxation in thin NbN, InO$_x$, and Au/Ni films at temperatures above 5 K. The studied samples are made up of metal bridges on an amorphous insulating layer lying on or suspended above a crystalline substrate. Noise thermometry was used to measure the electron temperature $T_e$ of the films as a function of Joule power per unit of area $P_{2D}$. In all samples, we observe the dependence $P_{2D}\propto T_e^n$ with the exponent $n\simeq 2$, which is inconsistent with both electron-phonon coupling and Kapitza thermal resistance. In suspended samples, the functional dependence of $P_{2D}(T_e)$ on the length of the amorphous insulating layer is consistent with the linear $T$-dependence of the thermal conductivity, which is related to lattice excitations (diffusons) for the phonon mean free path smaller than the dominant phonon wavelength. Our findings are important for understanding the operation of devices embedded in amorphous dielectrics.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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