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arXiv 1607.04682cond-mat.mtrl-sci
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界面对脉冲laser沉积MoS2薄膜中红外光热响应的影响

Effect of interface on mid-infrared photothermal response of MoS2 thin film grown by pulsed laser deposition

Ankur Goswami, Priyesh Dhandaria, Soupitak Pal, Faheem Khan, Željka Antić, Ravi Gaikwad, Kovur Prashanthi, Thomas Thundat

摘要:

本文报道了用脉冲激光沉积(PLD)技术在晶态(p型硅和c轴取向的单晶蓝宝石)和非晶态(Si/SiO_2和Si/SiN)衬底上生长的多层MoS_2薄膜的中红外光热响应。用中红外(7 ~ 8.2 μm)光源照射MoS_2薄膜,测量了薄膜的光热响应,并测量了薄膜电阻的变化。我们发现,它是可能的,以提高电阻的温度系数(TCR)的二硫化钼薄膜通过控制界面,通过适当的选择衬底和生长条件。用XRD、Raman、AFM、XPS和TEM对PLD生长的薄膜进行了表征。高分辨透射电子显微镜(HRTEM)图像显示,MoS 2薄膜在蓝宝石衬底上以逐层方式生长,并存在失配位错。当在具有金刚石立方结构的衬底(例如硅)上生长时,由于生长孪晶的形成,层生长形态被破坏。在Si/SiO2或Si/SiN等非晶衬底上的生长形态有很大不同。与其它衬底上的膜相比,在硅上生长的MoS 2膜显示出非常高的TCR(~ 2.9%K-1)、中等IR灵敏度(delR/R= 5.2%)和响应度(8.7V/W)。

英文摘要:

Here we report mid infrared (mid-IR) photothermal response of multi layer MoS2 thin film grown on crystalline (p-type silicon and c-axis oriented single crystal sapphire) and amorphous substrates (Si/SiO2 and Si/SiN) by pulsed laser deposition (PLD) technique. The photothermal response of the MoS2 films was measured as changes in the resistance of MoS2 films when irradiated with mid IR (7 to 8.2 μm) source. We show that it is possible to enhance the temperature coefficient of resistance (TCR) of the MoS2 thin film by controlling the interface through proper choice of substrate and growth conditions. The thin films grown by PLD were characterized using XRD, Raman, AFM, XPS and TEM. High-resolution transmission electron microscopy (HRTEM) images show that the MoS2 films grow on sapphire substrate in a layer-by-layer manner with misfit dislocations. Layer growth morphology is disrupted when grown on substrates with diamond cubic structure such as silicon due to growth twin formation. The growth morphology is very different on amorphous substrates such as Si/SiO2 or Si/SiN. The MoS2 film grown on silicon shows a very high TCR (-2.9% K-1), mid IR sensitivity (delR/R=5.2 %) and responsivity (8.7 V/W) as compared to films on other substrates.

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