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arXiv 1406.4341cond-mat.mtrl-sci
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脉冲laser沉积法在GaP(111)衬底上制备ZnO外延层

Realization of epitaxial ZnO layers on GaP(111) substrates by pulsed laser deposition

S. D. Singh, R. S. Ajimsha, C. Mukherjee, Ravi Kumar, L. M. Kukreja, Tapas Ganguli

摘要:

采用脉冲激光沉积技术在GaP(111)衬底上外延生长了ZnO薄膜。在高分辨率X射线衍射测量中使用phi扫描确定ZnO层相对于GaP衬底的面外和面内外延关系为(0001)ZnO||(111)GaP和(-12-10)ZnO||(-110)GaP。ZnO的外延生长及其强烈的激子光致发光和非常弱的缺陷发光的结果表明,(111)取向的GaP可以作为一种潜在的缓冲层选择,用于在Si(111)衬底上集成ZnO基光电子器件。

英文摘要:

Epitaxy of ZnO layers on cubic GaP (111) substrates has been demonstrated using pulsed laser deposition. Out of plane and in-plane epitaxial relationship of ZnO layer with respect to GaP substrate determined using phi scans in high resolution X-ray diffraction measurements are (0001) ZnO || (111) GaP and (-1 2 -1 0) ZnO || (-1 1 0) GaP respectively. Our results of epitaxy of ZnO and its intense excitonic photoluminescence with very weak defect luminescence suggest that (111) oriented GaP can be a potential buffer layer choice for the integration of ZnO based optoelectronic devices on Si(111) substrates.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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