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arXiv 1406.3789physics.ins-dethep-ex
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40 nm FPGA实现的多链测量平均TDC

A Multi-chain Measurements Averaging TDC Implemented in a 40 nm FPGA

Qi Shen, Shubin Liu, Binxiang Qi, Qi An, Shengkai Liao, Chengzhi Peng, Weiyue Liu

摘要:

本文介绍了一种在40 nm工艺Virtex-6 FPGA上实现的高精度、高分辨率时间数字转换器(TDC)。多链测量平均结构用于克服由普通单抽头延迟链的固有单元延迟决定的分辨率限制。该结构提高了图像的分辨率和精度。在这种TDC中,输入信号同时连接到多个抽头延迟链(链数为M),并且每两个相邻链之间存在固定延迟单元。每个抽头延迟链只是一个普通的TDC,并且应该为命中输入信号生成TDC时间,因此对于命中信号应该获得总共M个TDC时间值。在平均之后,获得最终TDC时间。采用8个并联抽头延迟链实现了具有3 ps分辨率(即bin大小)和6.5 ps精度(即RMS)的TDC。采用单抽头延迟链的普通TDC可获得24 ps的分辨率和18 ps的精度。

英文摘要:

A high precision and high resolution time-to-digital converter (TDC) implemented in a 40 nm fabrication process Virtex-6 FPGA is presented in this paper. The multi-chain measurements averaging architecture is used to overcome the resolution limitation determined by intrinsic cell delay of the plain single tapped-delay chain. The resolution and precision are both improved with this architecture. In such a TDC, the input signal is connected to multiple tapped-delay chains simultaneously (the chain number is M), and there is a fixed delay cell between every two adjacent chains. Each tapped-delay chain is just a plain TDC and should generate a TDC time for a hit input signal, so totally M TDC time values should be got for a hit signal. After averaging, the final TDC time is obtained. A TDC with 3 ps resolution (i.e. bin size) and 6.5 ps precision (i.e. RMS) has been implemented using 8 parallel tapped-delay chains. Meanwhile the plain TDC with single tapped-delay chain yields 24 ps resolution and 18 ps precision.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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