arXivDaily arXiv每日学术速递 周一至周五更新
arXiv周末暂无论文更新,休息一下吧,周末愉快~~
arXiv 2607.07428cond-mat.mtrl-sci
收藏

通过射频磁控溅射沉积在Pt(111)/Al2O3(1-102)衬底上生长(111)织构的SrTiO3薄膜

Growth of (111)-textured SrTiO3 thin films on Pt(111)/Al2O3(1-102) substrates by rf magnetron sputter deposition

University of Maine(缅因大学)

Ekaterina Taylor, Ethan R. Cronk, Kalani Perera, Nuri W. Emanetoglu, Nicholas S. Bingham

AI总结:

研究通过射频磁控溅射在Pt(111)/Al2O3(1-102)衬底上生长(111)织构的SrTiO3薄膜,对比不同温度下生长的Pt模板对STO薄膜质量的影响,利用多种手段表征薄膜,得到高质量、低粗糙度且特定晶体取向的STO薄膜。

摘要:

20 - 30nm的高质量晶体结构且低粗糙度的SrTiO3薄膜可用作复杂氧化物的生长模板或电容器结构的介电材料。本工作通过射频磁控溅射在rAl2O3衬底上生长的Pt(111)模板上生长化学计量比的STO薄膜,研究生长参数及底层Pt模板结构性质对STO薄膜质量的影响。室温生长的Pt与高温生长的Pt对比表明,后者能得到高度有序的Pt和STO薄膜,具有准二维表面粗糙度。X射线衍射显示STO薄膜有(111)和(222)晶体取向,半高宽为0.2°,表明薄膜质量高。原子力显微镜测量显示STO薄膜粗糙度小于1nm,与底层Pt模板粗糙度相当。

英文摘要:

SrTiO3 thin films, 20-30nm, with high quality crystal structure and low roughness can be used as growth templates for complex oxides or as the dielectric materials for capacitor structures. In this work, stoichiometric STO thin films were grown by radio frequency magnetron sputtering on Pt (111) templates grown on rAl2O3 substrates, and the effects of growth parameters as well as the underlying Pt templates structural properties on the quality of STO films were studied. A comparison between room temp grown Pt and Pt grown at elevated temps showed that the latter lead to highly ordered Pt and STO films with quasi 2D surface roughness. Xray diffraction showed that the STO thin films had (111) and (222) crystal orientation. A rocking curve full width at half maximum value of 0.2° was achieved, indicating that the STO films are high-quality. The STO films have a roughness less than 1 nm, as measured using atomic force microscopy, comparable to the underlying Pt templates roughness.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑