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arXiv 2402.07155cond-mat.mtrl-sciphysics.app-ph
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扫描三维X射线衍射显微镜揭示CdTe太阳能电池中的晶界应变局域化

Grain boundary strain localization in CdTe solar cell revealed by Scanning 3D X-ray diffraction microscopy

A. Shukla, J. Wright, A. Henningsson, H. Stieglitz, E. Colegrove, L. Besley, C. Baur, S De Angelis, M. Stuckelberger, H. F. Poulsen, J. W. Andreasen

AI总结:

利用扫描三维X射线衍射显微镜以100 nm分辨率对CdTe太阳能电池吸收层进行非破坏性三维成像,揭示高应变主要集中在大角度晶界并形成与CdS层相连的连续通路,从而关联硫沿晶界扩散,为多晶材料晶界表征提供了新方法。

摘要:

碲化镉(CdTe)太阳能电池技术是助力提升绿色能源生产的有前景的候选方案。然而,杂质和结构缺陷是提高太阳能转换效率的主要障碍。晶界常常作为杂质的聚集位点,导致高扩散区域出现应变局域化。在本研究中,我们展示了利用扫描三维X射线衍射显微镜以100 nm的分辨率对CdTe太阳能电池吸收层内的晶粒、其相、取向和局部应变进行非破坏性三维成像。我们定量表征了孪晶界,并提出它们如何影响晶粒尺寸和取向分布。局部应变分析表明,应变主要与大角度晶界相关,而孪晶界并未表现出高应变值。我们还观察到高应变晶界形成了与CdS层相连的连续通路。因此,该高应变区域被认为与硫从CdS层沿晶界扩散有关。这一假设得到了SEM EDS和X射线荧光实验的支持。本工作所展示的方法和分析可应用于不同的多晶材料,在这些材料中,晶界性质的表征对于理解微观结构现象至关重要。

英文摘要:

Cadmium Telluride (CdTe) solar cell technology is a promising candidate to help boost green energy production. However, impurities and structural defects are major barriers to improving the solar power conversion efficiency. Grain boundaries often act as aggregation sites for impurities, resulting in strain localization in areas of high diffusion. In this study, we demonstrate the use of scanning 3D X-ray diffraction microscopy to non-destructively make 3D maps of the grains, their phase, orientation, and local strain within a CdTe solar cell absorber layer with a resolution of 100 nm. We quantify twin boundaries and suggest how they affect grain size and orientation distribution. Local strain analysis reveals that strain is primarily associated with high misorientation grain boundaries, whereas twin boundaries do not show high strain values. We also observe that high-strain grain boundaries form a continuous pathway connected to the CdS layer. Hence, this high-strain region is believed to be associated with the diffusion of sulfur from the CdS layer along grain boundaries. This hypothesis is supported by SEM EDS and X-ray fluorescence experiments. The method and analysis demonstrated in this work can be applied to different polycrystalline materials where the characterization of grain boundary properties is essential to understand the microstructural phenomena.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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