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arXiv 1008.3574cond-mat.mtrl-sci
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石墨烯中的晶界环

Grain Boundary Loops in Graphene

Eric Cockayne, Gregory M. Rutter, Nathan P. Guisinger, Jason N. Crain, Phillip N. First, Joseph A. Stroscio

摘要:

拓扑缺陷可以以意想不到的方式影响石墨烯的物理性质。利用它们的影响可以导致对材料强度和电性能的增强控制。在这里,我们提出了一类新的拓扑缺陷的石墨烯组成的一个旋转序列的位错,关闭自己,形成晶界环,要么保存在六方晶格中的原子数量或容纳空位/间隙重建,同时没有留下不满意的债券。在扫描隧道显微镜(STM)研究SiC(0001)上生长的外延石墨烯时,观察到一个晶界环作为“花”图案。我们发现,花缺陷具有最低的能量每位错核心的任何已知的拓扑缺陷在石墨烯,通过移动位错的聚结提供了一个自然的解释其增长。

英文摘要:

Topological defects can affect the physical properties of graphene in unexpected ways. Harnessing their influence may lead to enhanced control of both material strength and electrical properties. Here we present a new class of topological defects in graphene composed of a rotating sequence of dislocations that close on themselves, forming grain boundary loops that either conserve the number of atoms in the hexagonal lattice or accommodate vacancy/interstitial reconstruction, while leaving no unsatisfied bonds. One grain boundary loop is observed as a "flower" pattern in scanning tunneling microscopy (STM) studies of epitaxial graphene grown on SiC(0001). We show that the flower defect has the lowest energy per dislocation core of any known topological defect in graphene, providing a natural explanation for its growth via the coalescence of mobile dislocations.

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