arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1302.0177cond-mat.mtrl-sci
收藏

摩擦力显微镜:一种简单的技术,用于识别粗糙衬底上的石墨烯并绘制铜上石墨烯晶粒的取向

Friction force microscopy: a simple technique for identifying graphene on rough substrates and mapping the orientation of graphene grains on copper

Alexander J. Marsden, Mick Phillips, Neil R. Wilson

摘要:

在单原子厚度下,使用常规技术将石墨烯与其基底区分开是具有挑战性的。在本文中,我们表明,摩擦力显微镜(FFM)是一种简单而快速的技术,用于识别石墨烯的范围内的样品,从生长基板粗糙的绝缘体。我们表明,FFM是特别有效的表征生长在铜上的石墨烯,它可以关联的石墨烯生长的三维表面形貌和映射的石墨烯的晶体取向非破坏性,可重复性和高分辨率。我们预计FFM对于研究其他金属/局部结晶衬底(包括SiC)上的石墨烯生长以及研究其他二维材料(如二硫化钼和六方氮化硼)的生长同样有效。

英文摘要:

At a single atom thick, it is challenging to distinguish graphene from its substrate using conventional techniques. In this paper we show that friction force microscopy (FFM) is a simple and quick technique for identifying graphene on a range of samples, from growth substrates to rough insulators. We show that FFM is particularly effective for characterising graphene grown on copper where it can correlate the graphene growth to the three-dimensional surface topography and map the crystallographic orientation of the graphene nondestructively, reproducibly and at high resolution. We expect FFM to be similarly effective for studying graphene growth on other metal/locally crystalline substrates, including SiC, and for studying growth of other two-dimensional materials such as molybdenum disulphide and hexagonal boron nitride.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑