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arXiv 2103.14801cond-mat.mtrl-sci
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高分辨透射电子显微术中图像模拟的一种替代方法

An alternative method of image simulation in high resolution transmission electron microscopy

Usha Bhat, Ranjan Datta

摘要:

在对现有的高分辨透射电子显微镜图像模拟方法进行比较分析的基础上,提出了一种新的高分辨透射电子显微镜图像模拟方法。另一种方法是基于考虑原子中心的静电干涉仪类似于传统的离轴电子双棱镜在几个纳米的焦点变化。将模拟结果与在三阶球面像差(Cs)= -35微米和散焦= 1、4和8 nm的最佳组合下记录的2D材料MoS 2、BN的实验图像进行比较,发现两者吻合良好。

英文摘要:

An alternative approach to the image simulation in high resolution transmission electron microscopy (HRTEM) is introduced after comparative analysis of the existing image simulation methods. The alternative method is based on considering the atom center as an electrostatic interferometer akin to the conventional off-axis electron biprism within few nanometers of focus variation. Simulation results are compared with the experimental images of 2D materials of MoS2, BN recorded under the optimum combination of third order spherical aberration (Cs)= -35 micrometers and defocus = 1, 4, and 8 nm and are found to be in good agreement.

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