高分辨透射电子显微术中相位恢复的见解和替代建议
Insights and alternative proposals on the phase retrieval in high resolution transmission electron microscopy
摘要：
提出了一种直接从高分辨透射电子显微镜（HRTEM）记录的图像强度图中反演出射波函数（OEW）的重建方法。该方法是基于应用修改后的强度方程表示的HRTEM图像。比较讨论了现有的OEW重建方法，离轴电子全息和本建议。从MoS2、BN和ZnO的实验图像中提取的相移与理论参考值非常吻合。此外，还证明了衍射图样的傅里叶级数展开对于直接反演某种形式的孤立周期像函数是有效的。然而，对于非周期性对象信息，例如，缺陷、掺杂物、边缘等，第一种方法整体上起作用。
英文摘要：
Alternative reconstruction method is proposed on retrieving the object exit wave function (OEW) directly from the recorded image intensity pattern in high resolution transmission electron microscopy (HRTEM). The method is based on applying a modified intensity equation representing the HRTEM image. A comparative discussion is provided between the existing methodologies involved in reconstruction of OEW, off-axis electron holography and the present proposal. Phase shift extracted from the experimental images of MoS2, BN and ZnO are found to be in excellent agreement with the theoretical reference values. Additionally, it is shown that the Fourier series expansion of diffraction pattern is effective in retrieving the isolated and periodic image functions of certain form directly. However, for aperiodic object information e.g., defects, dopants, edges etc., the first method works in entirety.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
