通过进动抑制长程电磁场微分相衬扫描透射电子显微术中的动态衍射伪影
Suppressing dynamical diffraction artefacts in differential phase contrast scanning transmission electron microscopy of long-range electromagnetic fields via precession
摘要：
在微分相衬扫描透射电子显微镜（DPC-STEM），在动态衍射的样品厚度和局部晶体取向（由于样品弯曲）的变化所产生的变化可以产生的对比度相比，所产生的远距离电磁场探测这种技术。通过模拟，我们探索这些动态衍射文物的规模，并介绍了一个度量的大小，其混淆的对比度的贡献。我们表明，在几个毫弧度的角度范围内的进动可以抑制这种混淆的对比度由一到两个数量级。我们的探索中心周围的案例研究GaAs附近的[011]区轴取向使用探针形成孔径半角度的顺序为0.1毫拉德在300千电子伏，但发现的趋势和使用的方法，预计适用于更普遍。
英文摘要：
In differential phase contrast scanning transmission electron microscopy (DPC-STEM), variability in dynamical diffraction resulting from changes in sample thickness and local crystal orientation (due to sample bending) can produce contrast comparable to that arising from the long-range electromagnetic fields probed by this technique. Through simulation we explore the scale of these dynamical diffraction artefacts and introduce a metric for the magnitude of their confounding contribution to the contrast. We show that precession over an angular range of a few milliradian can suppress this confounding contrast by one-to-two orders of magnitude. Our exploration centres around a case study of GaAs near the [011] zone-axis orientation using a probe-forming aperture semiangle on the order of 0.1 mrad at 300 keV, but the trends found and methodology used are expected to apply more generally.
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