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arXiv 2008.02732cond-mat.mtrl-sci
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电子结构计算中深缺陷处的辐射俘获率

Radiative capture rates at deep defects from electronic structure calculations

Cyrus E. Dreyer, Audrius Alkauskas, John L. Lyons, Chris G. Van de Walle

摘要:

我们提出了一种方法来计算在半导体和绝缘体中的深缺陷的辐射载流子捕获系数的第一性原理。用混合密度泛函理论精确地描述了电子结构和晶格弛豫。捕获系数的计算提供了一个额外的验证这些泛函的准确性,在处理本地化的缺陷状态。我们还讨论了Condon近似的有效性,表明即使在大的晶格弛豫的近似是准确的。我们在GaAs:$V_\text{Ga}$ - $\text{Te}_\text{As}$和GAN:C $_\text{N}$上测试了该方法,对于它们,可靠的实验是可用的,并且证明与测量的捕获系数非常好的一致性。

英文摘要:

We present a methodology to calculate radiative carrier capture coefficients at deep defects in semiconductors and insulators from first principles. Electronic structure and lattice relaxations are accurately described with hybrid density functional theory. Calculations of capture coefficients provide an additional validation of the accuracy of these functionals in dealing with localized defect states. We also discuss the validity of the Condon approximation, showing that even in the event of large lattice relaxations the approximation is accurate. We test the method on GaAs:$V_\text{Ga}$-$\text{Te}_\text{As}$ and GaN:C$_\text{N}$, for which reliable experiments are available, and demonstrate very good agreement with measured capture coefficients.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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