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arXiv 1010.3443cond-mat.mtrl-sci
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直接生长在硅上的双折射SrTiO3中相干软模声子的产生和检测

Coherent soft-mode phonon generation and detection in ultrathin SrTiO3 grown directly on silicon

Cheng Cen, Maitri P. Warusawithana, Darrell G. Schlom, Jeremy Levy

摘要:

在室温下对直接生长在Si上的SrTiO 3薄膜进行了时间分辨双色泵浦-探测偏振光谱研究,薄膜厚度从2 nm到7.8 nm。具有0.2太赫兹的特征频率的E软模脉冲产生和测量在这些相干应变的四相SrTiO 3薄膜。另一个过阻尼信号表明,双势阱之间的Ti离子可能弛豫跳跃。相干声子信号对泵浦和探测激光偏振的依赖性有助于识别声子模式。

英文摘要:

Time-resolved two color pump-probe polarization spectroscopy was performed at room temperature on SrTiO3 films grown directly on Si with film thickness varying from 2 nm to 7.8 nm. The E soft mode with a characteristic frequency of 0.2 THz is impulsively generated and measured in these coherently strained tetragonal phase SrTiO3 thin films. Another over-damped signal observed indicates the possible relaxational hopping of Ti ion between double potential wells. The dependence of the coherent phonon signal on pump and probe laser polarization helps to identify the phonon modes.

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