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arXiv 0902.3535cond-mat.str-el
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Thickness dependence of the mobility at the LaAlO_3 / SrTiO_3 interface

C. Bell, S. Harashima, Y. Hikita, H. Y. Hwang

英文摘要:

The electronic transport properties of a series of LaAlO_3 / SrTiO_3 interfaces were investigated, and a systematic thickness dependence of the sheet resistance and magnetoresistance was found for constant growth conditions. This trend occurs above the critical thickness of four unit cells, below which the LaAlO_3 / SrTiO_3 interface is not conducting. A dramatic decrease in mobility of the electron gas of nearly two orders of magnitude was observed with increasing LaAlO_3 thickness from five to 25 unit cells.

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