arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1312.2181cond-mat.str-elcond-mat.mtrl-sci
收藏

二维电子气在LaAlO3/SrTiO3界面上的载流子数涨落

Carrier-number fluctuations in the 2-dimensional electron gas at the LaAlO3/SrTiO3 interface

C. Barone, F. Romeo, S. Pagano, E. Di Gennaro, F. Miletto Granozio, I. Pallecchi, D. Marre, U. Scotti di Uccio

摘要:

研究了LaAlO_3/SrTiO_3界面二维电子气的电压谱密度SV(f)。低频分量具有明显的1/f行为,具有二次偏置电流依赖性,归因于电阻波动。然而,它的温度依赖性是不符合经典的Hooge模型,载流子迁移率波动的基础上。实验结果,而不是,解释在载流子数波动方面,由于激发捕获机制的2维电子气。

英文摘要:

The voltage-spectral density SV(f) of the 2-dimensional electron gas formed at the interface of LaAlO3 /SrTiO3 has been thoroughly investigated. The low-frequency component has a clear 1/f behavior with a quadratic bias current dependence, attributed to resistance fluctuations. However, its temperature dependence is inconsistent with the classical Hooge model, based on carrier-mobility fluctuations. The experimental results are, instead, explained in terms of carrier-number fluctuations, due to an excitation-trapping mechanism of the 2-dimensional electron gas.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑