arXivDaily arXiv每日学术速递 周一至周五更新
arXiv周末暂无论文更新,休息一下吧,周末愉快~~
arXiv 0710.1395cond-mat.mtrl-scicond-mat.str-el
收藏

LaAlO3/SrTiO3异质结构中载流子空间分布的测绘

Mapping the Spatial Distribution of Charge Carriers in LaAlO3/SrTiO3 Heterostructures

M. Basletic, J. -L. Maurice, C. Carretero, G. Herranz, O. Copie, M. Bibes, E. Jacquet, K. Bouzehouane, S. Fusil, A. Barthelemy

摘要:

在复杂的绝缘氧化物之间的界面处,可能会出现具有有趣性质的新相,例如LaAlO 3/SrTiO 3系统中报道的金属态。虽然这种状态已经被预测和报道局限于界面,但一些作品表明更广泛的空间延伸,从而质疑其起源。在这里,我们提供了第一次直接测定该系统的载流子密度分布,通过电阻分布图收集在横截面LaAlO 3/SrTiO 3样品与导电尖端原子力显微镜(CT-AFM)。我们发现,取决于特定的生长协议,高迁移率电子气的空间延伸可以从数百微米到SrTiO 3到几个纳米旁边的LaAlO 3/SrTiO 3界面。我们的研究结果强调了CT-AFM作为一种新的工具来表征复杂的氧化物界面的潜力,并为我们提供了一个明确的和决定性的方式来调和在这个系统中的实验数据的身体。

英文摘要:

At the interface between complex insulating oxides, novel phases with interesting properties may occur, such as the metallic state reported in the LaAlO3/SrTiO3 system. While this state has been predicted and reported to be confined at the interface, some works indicate a much broader spatial extension, thereby questioning its origin. Here we provide for the first time a direct determination of the carrier density profile of this system through resistance profile mappings collected in cross-section LaAlO3/SrTiO3 samples with a conducting-tip atomic force microscope (CT-AFM). We find that, depending upon specific growth protocols, the spatial extension of the high-mobility electron gas can be varied from hundreds of microns into SrTiO3 to a few nanometers next to the LaAlO3/SrTiO3 interface. Our results emphasize the potential of CT-AFM as a novel tool to characterize complex oxide interfaces and provide us with a definitive and conclusive way to reconcile the body of experimental data in this system.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑