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arXiv 0812.2071cond-mat.str-elcond-mat.other
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氧化物异质结与半导体电子器件的区别

Difference of Oxide Hetero-Structure Junctions with Semiconductor Electronic Devices

Guangcheng Xiong, Yuansha Chen, Liping Chen, Guijun Lian

摘要:

在Pr0.7Ca0.3MnO3(PCMO)异质结中进行的载流子注入表现出与半导体器件完全不同的特性,在没有电场的情况下,载流子注入是稳定的,并且电阻和界面势垒都发生了剧烈的变化。界面势垒的消失和反转表明,这种异质结构氧化物器件的可调电阻开关应该与跨界面的载流子运动有关。结果表明,注入的载流子仍停留在器件中,并引起器件性质的变化,导致了强关联电子结构中载流子自捕获和释放的现象。在PCMO和CeO_2缺氧器件中的观察表明,氧化物作为功能材料可以在微电子学中得到应用,具有一些新的性质,其中界面是非常重要的。

英文摘要:

Charge carrier injection performed in Pr0.7Ca0.3MnO3 (PCMO) hetero-structure junctions exhibits stable without electric fields and dramatic changes in both resistances and interface barriers, which are entirely different from behaviors of semiconductor devices. Disappearance and reversion of interface barriers suggest that the adjustable resistance switching of such hetero-structure oxide devices should associate with motion of charge carriers across interfaces. The results suggested that injected carriers should be still staying in devices and resulted in changes in properties, which guided to a carrier self-trapping and releasing picture in strongly correlated electronic framework. Observations in PCMO and oxygen deficient CeO2 devices show that oxides as functional materials could be used in microelectronics with some novel properties, in which interface is very important.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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