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arXiv 0810.1926cond-mat.str-elcond-mat.mtrl-sci
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共振软X射线散射研究SrTiO $_3$ / LaAlO $_3$界面的电子结构

Electronic structure of the SrTiO$_3$/LaAlO$_3$ interface revealed by resonant soft x-ray scattering

H. Wadati, D. G. Hawthorn, J. Geck, T. Higuchi, Y. Hikita, H. Y. Hwang, S. -W. Huang, D. J. Huang, H. -J. Lin, C. Schussler-Langeheine, H. -H. Wu, E. Schierle, … 展开作者

H. Wadati, D. G. Hawthorn, J. Geck, T. Higuchi, Y. Hikita, H. Y. Hwang, S. -W. Huang, D. J. Huang, H. -J. Lin, C. Schussler-Langeheine, H. -H. Wu, E. Schierle, E. Weschke, G. A. Sawatzky

摘要:

利用共振软X射线散射研究了SrTiO $_3$ /LaAlO $_3$超晶格的电子结构。在所有光子能量下都观察到了(003)峰,这是我们的“理想”SL结构所禁止的,表明在界面处发生了重构。从峰位分析考虑到折射的影响,我们得到的证据,电子重建的Ti 3d和O $2p$状态在界面上。从反射率分析,我们得出结论,AlO $_2$ /LaO/TiO $_2$ /SrO和TiO $_2$ /SrO/AlO $_2$ /LaO界面是相当不同的,导致高度不对称的性能。

英文摘要:

We investigated the electronic structure of the SrTiO$_3$/LaAlO$_3$ superlattice (SL) by resonant soft x-ray scattering. The (003) peak, which is forbidden for our "ideal" SL structure, was observed at all photon energies, indicating reconstruction at the interface. From the peak position analyses taking into account the effects of refraction, we obtained evidence for electronic reconstruction of Ti 3d and O $2p$ states at the interface. From reflectivity analyses, we concluded that the AlO$_2$/LaO/TiO$_2$/SrO and the TiO$_2$/SrO/AlO$_2$/LaO interfaces are quite different, leading to highly asymmetric properties.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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