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arXiv 2104.11518cond-mat.mes-hall
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单层石墨烯FETs偏压相关本征RF热噪声建模与表征

Bias-dependent intrinsic RF thermal noise modeling and characterization of single layer graphene FETs

Nikolaos Mavredakis, Anibal Pacheco-Sanchez, Paulius Sakalas, Wei Wei, Emiliano Pallecchi, Henri Happy, David Jimenez

摘要:

本文通过实验观察和紧凑建模,深入研究了单层石墨烯场效应晶体管(GFET)本征沟道热噪声的偏置依赖性。研究结果表明,随着漏电流的增加,而在很高的载流子密度制度的饱和趋势观察到的特定噪声的增加。此外,在较高的电场下,短沟道效应如速度饱和也会导致噪声的增加。这项工作的主要目标是提出一个基于物理的紧凑模型,占和准确地预测上述实验观察短沟道GFET。与之前采用的基于长沟道MOSFET的模型来描述石墨烯器件中的热噪声而不考虑石墨烯的简并性质相反,在这项工作中,提出了一种用于短沟道GFET的模型,该模型包含2D材料的物理基础并包括偏置依赖性。实现的模型进行了验证,从两个短沟道器件在准静态操作区域的去嵌入高频数据。该模型精确地描述了一个广泛的低到高的漏电流值的实验数据,而不需要任何拟合参数。此外,石墨烯的简并性质的考虑揭示了与非简并情况相比噪声的显著降低,并且模型准确地捕获了这种行为。这项工作也可以从电路设计师方面最重要的意义,因为噪声过剩因子,一个非常重要的品质因数RF电路的实现,是第一次在石墨烯晶体管的定义和特点。

英文摘要:

In this article, the bias-dependence of intrinsic channel thermal noise of single-layer graphene field-effect transistors (GFETs) is thoroughly investigated by experimental observations and compact modeling. The findings indicate an increase of the specific noise as drain current increases whereas a saturation trend is observed at very high carrier density regime. Besides, short-channel effects like velocity saturation also result in an increment of noise at higher electric fields. The main goal of this work is to propose a physics-based compact model that accounts for and accurately predicts the above experimental observations in short-channel GFETs. In contrast to long-channel MOSFET based models adopted previously to describe thermal noise in graphene devices without considering the degenerate nature of graphene, in this work a model for short-channel GFETs embracing the 2D materials underlying physics and including a bias dependency is presented. The implemented model is validated with de-embedded high frequency data from two short-channel devices at Quasi-Static region of operation. The model precisely describes the experimental data for a wide range of low to high drain current values without the need of any fitting parameter. Moreover, the consideration of the degenerate nature of graphene reveals a significant decrease of noise in comparison with the non degenerate case and the model accurately captures this behavior. This work can also be of outmost significance from circuit designers aspect, since noise excess factor, a very important figure of merit for RF circuits implementation, is defined and characterized for the first time in graphene transistors.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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