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arXiv 1208.2156cond-mat.mes-hall
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短沟道石墨烯场效应晶体管中的接触诱导负微分电阻

Contact-induced negative differential resistance in short-channel graphene FETs

Roberto Grassi, Tony Low, Antonio Gnudi, Giorgio Baccarani

摘要:

在这项工作中,我们澄清的物理机制,负输出微分电阻(NDR)的现象,在短沟道石墨烯场效应管(GFET)通过非平衡格林函数(NEGF)模拟和一个简单的半解析弹道模型,捕捉基本的物理。这种NDR现象是由于在包括接触的不同器件区域中由石墨烯狄拉克点引起的传输模式瓶颈效应。发现仅当栅极偏置产生沿沟道的n-p-n或p-n-p极性配置时,对于正和负漏极-源极电压扫描,才会发生NDR。此外,我们也探讨了接触感应能量展宽的源漏区和有限的接触电阻对负阻效应的影响。

英文摘要:

In this work, we clarify the physical mechanism for the phenomenon of negative output differential resistance (NDR) in short-channel graphene FETs (GFETs) through non-equilibrium Green's function (NEGF) simulations and a simpler semianalytical ballistic model that captures the essential physics. This NDR phenomenon is due to a transport mode bottleneck effect induced by the graphene Dirac point in the different device regions, including the contacts. NDR is found to occur only when the gate biasing produces an n-p-n or p-n-p polarity configuration along the channel, for both positive and negative drain-source voltage sweep. In addition, we also explore the impact on the NDR effect of contact-induced energy broadening in the source and drain regions and a finite contact resistance.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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