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arXiv 2302.04616cond-mat.mes-hall
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单层石墨烯场效应管的直接偏置和频率相关小信号模型提取

Straightforward Bias and Frequency Dependent Small-Signal Model Extraction for Single-Layer Graphene FETs

Nikolaos Mavredakis, Anibal Pacheco-Sanchez, Wei Wei, Emiliano Pallecchi, Henri Happy, David Jiménez

摘要:

我们提出了一个明确的小信号石墨烯场效应晶体管(GFET)的参数提取过程的基础上,基于电荷的准静态模型。小信号参数对栅极电压和频率的依赖性通过300 nm器件的高频(高达18 GHz)晶圆测量精确验证。这些参数的研究同时进行,与其他作品只专注于少数。有效的程序已被应用到GFET的第一次,以消除接触和栅极电阻的Y参数。这些方法的使用产生直接的方程提取的小信号模型参数,这是非常有用的射频电路设计。此外,我们第一次显示实验验证与栅极电压和频率的固有GFET非互易电容模型。精确的模型也提出了门电压依赖的测量单位增益和最大振荡频率,以及电流和功率增益。

英文摘要:

We propose an explicit small-signal graphene field-effect transistor (GFET) parameter extraction procedure based on a charge-based quasi-static model. The dependence of the small-signal parameters on both gate voltage and frequency is precisely validated by high-frequency (up to 18 GHz) on-wafer measurements from a 300 nm device. These parameters are studied simultaneously, in contrast to other works which focus exclusively on few. Efficient procedures have been applied to GFETs for the first time to remove contact and gate resistances from the Y-parameters. The use of these methods yields straightforward equations for extracting the small-signal model parameters, which is extremely useful for radio-frequency circuit design. Furthermore, we show for the first time experimental validation vs. both gate voltage and frequency of the intrinsic GFET non-reciprocal capacitance model. Accurate models are also presented for the gate voltage-dependence of the measured unity-gain and maximum oscillation frequencies as well as of the current and power gains.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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