单层石墨烯FET的输入参考低频噪声分析
Input referred low-frequency noise analysis for single-layer graphene FETs
摘要：
输入相关低频噪声（LFN）SVG的偏置依赖性是RF电路设计的一个重要方面。SVG在硅晶体管中被认为是恒定的，但这与最近的实验和理论研究相矛盾。在这封信中，SVG的行为研究单层石墨烯晶体管的基础上最近建立的基于物理的完整紧凑的LFN模型。SVG的最小值记录在偏置点处，最大值位于偏置点处，该偏置点与归一化输出LFN的众所周知的M形的峰值重合，并且模型精确地捕捉到这一趋势。迁移率波动效应使SVG朝向电荷中性点（CNP）附近的较低电流增加，而载流子数波动和串联电阻效应主要贡献远离CNP;因此，SVG获得与CMOS器件类似的抛物线形状与栅极电压。
英文摘要：
The bias-dependence of input referred low-frequency noise (LFN), SVG, is a considerable facet for RF circuit design. SVG was considered constant in silicon transistors but this was contradicted by recent experimental and theoretical studies. In this letter, the behaviour of SVG is investigated for single-layer graphene transistors based on a recently established physics-based complete compact LFN model. A minimum of SVG is recorded at the bias point where maximum transconductance is located which coincides with the peak of the well-known M-shape of the normalized output LFN and the model precisely captures this trend. Mobility fluctuation effect increases SVG towards to lower currents near charge neutrality point (CNP) while carrier number fluctuation and series resistance effects mostly contribute away from CNP; thus, SVG obtains a parabolic shape vs. gate voltage similarly to CMOS devices.
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