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arXiv 1801.09451cond-mat.mtrl-sci
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Band alignments of electronic energy structure in epitaxially grown \b{eta}-Ga2O3 layers

D. A. Zatsepin, D. W. Boukhvalov, A. F. Zatsepin, Yu. A. Kuznetsova, D. Gogova, V. Ya. Shur, A. A. Esin

英文摘要:

Gallium oxide epitaxial layers grown on native substrates and basal plane sapphire were characherized by X-ray phtotelectron and optical reflectance spectroscopies. The XPS electronic structure mapping was coupled to Density functional theory calculations.

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