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arXiv 1712.01686cond-mat.mtrl-sci
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半导体和绝缘体中动力学过程期间的过渡态氧化还原

Transition state redox during dynamical processes in semiconductors and insulators

Guangfu Luo, Thomas F. Kuech, Dane Morgan

AI总结:

本研究指出半导体和绝缘体非氧化还原动力学过程中过渡态可发生电荷态变化,提出纳入该效应的方法,解释其对激活势垒及 Fermi 能级依赖的影响。

摘要:

与离子扩散和化学反应相关的激活势垒,对于理解和预测材料生长、离子输运以及催化等广泛现象至关重要。在计算半导体和绝缘体中非氧化还原过程的激活势垒时,人们普遍假设在整个动力学过程中,电荷状态始终保持为初始电子基态的电荷状态。在本工作中,我们证明这一假设通常是不准确的,并且限速过渡态可能具有与初始基态不同的电荷状态。这一现象可以显著降低强烈依赖于电荷状态的动力学过程的激活势垒,例如 4H-SiC 中的碳空位扩散。通过纳入这种过渡态氧化还原,激活势垒随 Fermi 能级连续变化,这与传统固定电荷假设所预测的阶跃线特征形成对比。在本研究中,我们提供了一种纳入过渡态氧化还原效应的直接方法,识别了该效应发挥重要作用的典型情形,并讨论了相关的电子动力学。

英文摘要:

Activation barriers associated with ion diffusion and chemical reactions are vital to understand and predict a wide range of phenomena, such as material growth, ion transport, and catalysis. In the calculation of activation barriers for non-redox processes in semiconductors and insulators, it has been widely assumed that the charge state remains fixed to that of the initial electronic ground state throughout a dynamical process. In this work, we demonstrate that this assumption is generally inaccurate and that a rate-limiting transition state can have a different charge state from the initial ground state. This phenomenon can significantly lower the activation barrier of dynamical process that depends strongly on charge state, such as carbon vacancy diffusion in 4H-SiC. With inclusion of such transition state redox, the activation barrier varies continuously with Fermi level, in contrast to the step-line feature predicted by the traditional fixed-charge assumption. In this study, a straightforward approach to include the transition state redox effect is provided, the typical situations where the effect plays a significant role are identified, and the relevant electron dynamics are discussed.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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