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arXiv 0812.4958cond-mat.mtrl-sci
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电容电压探针时间分辨测量界面电荷转移

Time-Resolved Measurements of the Interfacial Charge Transfers by Capacitive Voltage Probe

Andrei V. Pakoulev, Vladimir Burtman, Dmitry Zaslavsky

摘要:

当氧化还原活性分子共价连接到n掺杂硅的表面时,光诱导它们被半导体氧化。为了使这种电荷分离可视化,我们通过辅助透明电极跟踪了表面光电压的形成和衰减,该辅助透明电极用作拾取瞬态表面光电压的电容探针。这种方法已用于电子学和生物物理学,但对于表面氧化还原化学是新颖的。探针提供了电荷转移的方向和动力学的分辨率。它的应用与半导体的光学性质无关。激光引发的反应允许定量测量的反应速率常数~108-103 s-1。电子从共价连接的NTCI(A)分子注入硅中的速度很快(k >109 s-1)。背电子转移是多分散的,其组分范围从~10微秒以上。

英文摘要:

When redox active molecules are covalently tethered to the surface of the n-doped silicon, light induces their oxidation by the semiconductor. To visualize this charge separation we have followed the formation and decay of the surface photovoltage by an auxiliary transparent electrode, which serves as a capacitive probe that picks up the transient surface photovoltage. This method has been used in electronics and biophysics but is novel for the surface redox chemistry. The probe provides both the direction of the charge transfer and the resolution of the dynamics. Its application is independent of the optical properties of the semiconductor. Laser initiation of the reaction permits quantitative measurements of the reactions with the rate constants ~108-103 s-1. The electron injection from covalently tethered NTCI(A) molecules into silicon was fast (k >109 s-1). The back electron transfer is poly-disperse with the components ranging from ~10 microseconds and up.

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