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arXiv 2309.03474cond-mat.mtrl-sciphysics.comp-ph
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半导体中由绝缘体-金属转变驱动的巨表观挠曲电效应

Giant Apparent Flexoelectricity in Semiconductors Driven by Insulator-to-metal Transition

Ya-Xun Wang, Jian-Gao Li, Gotthard Seifert, Kai Chang, Dong-Bo Zhang

AI总结:

本研究利用广义Bloch定理发现高应变梯度引发的绝缘体-金属转变使弯曲的Si和Ge薄膜产生巨表观挠曲电效应,揭示了电子转移极化新机制。

摘要:

我们阐明了材料在高应变梯度区间的挠曲电效应,其潜在机制目前尚不清晰。通过使用广义 Bloch 定理,我们在弯曲的 Si 和 Ge 薄膜中发现了一种强烈的类挠曲电效应,这是由高应变梯度引发的绝缘体-金属转变所致。我们表明,在弯曲薄膜的压缩侧和伸长侧之间形成了一种不寻常的 type-II 能带对齐,导致了电子和空穴的空间分离。因此,在发生绝缘体-金属转变时,电子从压缩侧转移到伸长侧以达到热力学平衡,从而沿薄膜厚度方向产生了显著的极化。所得的横向挠曲电系数出乎意料地高,且对薄膜厚度表现出二次依赖关系。这种新机制可扩展到其他具有适中能隙的半导体材料。我们的发现对未来挠曲电效应在半导体材料中的应用具有重要意义。

英文摘要:

We elucidate the flexoelectricity of materials in the high strain gradient regime, of which the underlying mechanism is less understood. By using the generalized Bloch theorem, we uncover a strong flexoelectric-like effect in bent thinfilms of Si and Ge due to a high strain gradient-induced insulator-to-metal transition. We show that an unusual type-II band alignment is formed between the compressed and elongated sides of the bent film, resulting in a spatial separation of electron and hole. Therefore, upon the insulator-to-metal transition, electrons transfer from the compressed side to the elongated side to reach the thermodynamic equilibrium, leading to pronounced polarization along the film thickness dimension. The obtained transverse flexoelectric coefficients are unexpectedly high, with a quadratic dependence on the film thickness. This new mechanism is extendable to other semiconductor materials with moderate energy gaps. Our findings have important implications for the future applications of flexoelectricity in semiconductor materials.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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