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arXiv 1303.0086cond-mat.mtrl-sci
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基于化学气相沉积单晶MoS2晶粒的高迁移率和高开/关比场效应晶体管

High mobility and high on/off ratio field-effect transistors based on chemical vapor deposited single-crystal MoS2 grains

Wei Wu, Debtanu De, Su-Chi Chang, Yanan Wang, Haibing Peng, Jiming Bao, Shin-Shem Pei

摘要:

我们报告了场效应晶体管(FET)与单晶二硫化钼(MoS 2)的化学气相沉积(CVD)合成的通道。对于双层MoS 2 FET,迁移率为~17 cm ~ 2 V ~(-1)s ~(-1),开/关电流比为~108,这比基于CVD多晶MoS 2膜的FET高得多。通过避免由转移过程引入的晶界和污染的有害影响,直接沉积在SiO2上的CVD MoS 2原子层的质量与最佳剥离的MoS 2薄片相当。结果表明,CVD法是制备高质量MoS_2原子层的一种可行方法。

英文摘要:

We report field-effect transistors (FETs) with single-crystal molybdenum disulfide (MoS2) channels synthesized by chemical vapor deposition (CVD). For a bilayer MoS2 FET, the mobility is ~17 cm2V-1s-1 and the on/off current ratio is ~108, which are much higher than those of FETs based on CVD polycrystalline MoS2 films. By avoiding the detrimental effects of the grain boundaries and the contamination introduced by the transfer process, the quality of the CVD MoS2 atomic layers deposited directly on SiO2 is comparable to the best exfoliated MoS2 flakes. It shows that CVD is a viable method to synthesize high quality MoS2 atomic layers.

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