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arXiv 2402.07280cond-mat.mtrl-scicond-mat.soft
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共振软X射线散射揭示多组分气相沉积玻璃的分层结构

Resonant soft X-ray scattering reveals hierarchical structure in a multi-component vapor-deposited glass

Camille Bishop, Thomas J. Ferron, Marie E. Fiori, Connor G. Bischak, Eliot Gann, Cherno Jaye, Mark D. Ediger, Dean M. DeLongchamp

AI总结:

本文利用共振软X射线散射(RSoXS)结合AFM和PiFM技术,揭示了TPD和DO37共沉积玻璃中依赖基底温度的相分离隐藏长度尺度,并证明真空散射对分析结果的显著影响,为调控多组分材料形貌指明了路径。

摘要:

多相气相沉积玻璃是有机电子学,特别是有机光伏和热电器件的重要材料。这些共混物常被视为分子合金,目前关于其纳米尺度结构的研究较少。我们展示了TPD和Disperse Orange 37(两种小分子玻璃形成体)的共沉积系统会分离成成分截然不同的相,其畴尺寸和间距取决于沉积过程中的基底温度。在较高沉积温度下,富含其中一种组分的畴变得更大且更纯。我们使用共振软X射线散射(RSoXS),并辅以原子力显微镜(AFM)和光诱导力显微镜(PiFM)来测量沉积薄膜的相分离、形貌和纯度。我们采用一种RSoXS分析的正向模拟方法——国家标准与技术研究院(NIST)RSoXS模拟套件(NRSS),结合由AFM图像建立的模型,评估了跨多个长度尺度的散射能量依赖性,并根据薄膜内部结构对RSoXS进行了解释。我们发现RSoXS对相分离的隐藏长度尺度很敏感,而这仅从AFM表征中是无法明显看出的。我们证明了在RSoXS分析中常被忽略的真空散射对RSoXS图形的特征和能量依赖性有显著贡献,随后阐明了如何正确考虑真空散射以分析具有显著粗糙度的薄膜。我们随后使用这一分析框架来理解TPD-DO37共沉积玻璃气相沉积过程中发生的结构发展机制,其结果为调控多组分材料的形貌指明了路径。

英文摘要:

Multi-phase vapor-deposited glasses are an important class of materials for organic electronics, particularly organic photovoltaics and thermoelectrics. These blends are frequently regarded as molecular alloys and there have been few studies of their structure at nanometer scales. Here we show that a co-deposited system of TPD and Disperse Orange 37, two small molecule glass-formers, separates into compositionally distinct phases with a domain size and spacing that depends on substrate temperature during deposition. Domains rich in one of the two components become larger and more pure at higher deposition temperatures. We use resonant soft X-ray scattering (RSoXS) complemented with Atomic Force Microscopy (AFM) and photo-induced force microscopy (PiFM) to measure the phase separation, topography, and purity of the deposited films. A forward-simulation approach to RSoXS analysis, the National Institute of Standards and Technology (NIST) RSoXS Simulation Suite (NRSS), is used with models developed from AFM images to evaluate the energy dependence of scattering across multiple length scales and interpret the RSoXS with respect to structure within the films. We find that the RSoXS is sensitive to a hidden length scale of phase separation that is not apparent from the AFM characterization alone. We demonstrate that vacuum scattering, which is often ignored in RSoXS analysis, contributes significantly to the features and energy dependence of the RSoXS pattern, and then illustrate how to properly account for vacuum scattering to analyze films with significant roughness. We then use this analysis framework to understand structure development mechanisms that occur during vapor deposition of a TPD-DO37 co-deposited glass with results that outline paths to tune morphology in multi-component materials.

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