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arXiv 1012.5338cond-mat.mtrl-sci
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热氧化法生长Cu2O纳米线的结构缺陷与光学性能的相关性

Correlation between structural defects and optical properties of Cu2O nanowires grown by thermal oxidation

Qilin Gu, B. Wang

摘要:

采用简单的无催化剂热氧化法在铜箔衬底上生长了氧化亚铜(Cu 2 O)纳米线。通过改变氧分压和加热温度,在不同的条件下进行线生长,并通过透射电子显微镜,其特征在于所产生的结构缺陷,如堆垛层错和生长的纳米线的孪晶结构。研究发现,适当的氧分压(~5%)和相对较高的温度(500 oC)是生长高质量Cu 2 O纳米线的最佳条件,而降低温度或提高氧分压都可以产生更高密度的平面缺陷。为了进一步研究生长的纳米线的光学性质,光致发光测量也进行了相关的结构表征结果,表明结构缺陷,如堆垛层错和孪晶的增加往往会增强宽缺陷相关的发射和抑制附近的Cu 2 O带边的激子发射。

英文摘要:

Cuprous oxide (Cu2O) nanowires were grown by a simple, catalyst-free thermal oxidation method starting from a copper foil substrate. Wire growth was performed at different conditions by varying oxygen partial pressure and heating temperature, and produced structural defects such as stacking faults and twin structures of grown nanowires were characterized by transmission electron microscopy. A moderate oxygen partial pressure ~5% with a relatively high temperature at 500 oC is found to be an optimal condition for growing high-quality Cu2O nanowires, while either lowering temperature or enhancing O2 partial pressure can yield higher density of planar defects. In order to further investigate optical properties of grown nanowires, photoluminescence measurements were also performed and correlated with structural characterization results, indicating that increase of structural defects such as stacking faults and twins tended to enhance broad defect-related emissions and suppress the exciton emissions near Cu2O band-edge.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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