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arXiv 1002.0430cond-mat.mtrl-scicond-mat.mes-hall
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氧化硅纳米线的弹道电导

Ballistic Conductance in Oxidized Si Nanowires

Giorgos Fagas, James C. Greer

摘要:

利用密度泛函理论结合格林函数散射方法研究了硅纳米线中局部氧化对空穴输运的影响,以及改变硅原子在线表面的氧化态的影响.对于硅纳米线的生长方向沿[110]和几个纳米的直径,它被发现,引入氧桥和背键不显着降低空穴传输的电压高达几百毫伏相对于价带边缘。因此,平均自由程与晶体管和其他纳米电子应用所设想的线长度相当或更长。沿着[100]取向的纳米线的传输是不太有利的,因此在空穴迁移率方面为[110]纳米线取向提供了优势,如在一些生长方法中优先产生的。

英文摘要:

The influence of local oxidation in silicon nanowires on hole transport, and hence the effect of varying the oxidation state of silicon atoms at the wire surface, is studied using density functional theory in conjunction with a Green's function scattering method. For silicon nanowires with growth direction along [110] and diameters of a few nanometers, it is found that the introduction of oxygen bridging and back bonds does not significantly degrade hole transport for voltages up to several hundred millivolts relative to the valence band edge. As a result, the mean free paths are comparable to or longer than the wire lengths envisioned for transistor and other nanoelectronics applications. Transport along [100]-oriented nanowires is less favorable, thus providing an advantage in terms of hole mobilities for [110] nanowire orientations, as preferentially produced in some growth methods.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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