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arXiv 0711.3206cond-mat.mes-hall
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石墨烯中的散粒噪声

Shot Noise in Graphene

L. DiCarlo, J. R. Williams, Yiming Zhang, D. T. McClure, C. M. Marcus

摘要:

我们报告的测量电流噪声在单层和多层石墨烯设备。在包括pn结的四个单层器件中,在改变载流子类型和密度时,Fano因子保持恒定在+/-10%以内,并且平均值在0.35和0.38之间。多层器件中的Fano因子从电荷中性点的最大值0.33降低到高载流子密度时的0.25。这些结果进行了比较,弹道和无序石墨烯的散粒噪声的理论预测。

英文摘要:

We report measurements of current noise in single- and multi-layer graphene devices. In four single-layer devices, including a p-n junction, the Fano factor remains constant to within +/-10% upon varying carrier type and density, and averages between 0.35 and 0.38. The Fano factor in a multi-layer device is found to decrease from a maximal value of 0.33 at the charge-neutrality point to 0.25 at high carrier density. These results are compared to theoretical predictions for shot noise in ballistic and disordered graphene.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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