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arXiv 1603.04546cond-mat.mes-hall
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石墨烯中1/f噪声在电中性点附近的反常行为

Anomalous behavior of 1/f noise in graphene near the charge neutrality point

Shunpei Takeshita, Sadashige Matsuo, Takahiro Tanaka, Shu Nakaharai, Kazuhito Tsukagoshi, Takahiro Moriyama, Teruo Ono, Tomonori Arakawa, Kensuke Kobayashi

摘要:

我们研究了单层石墨烯器件中从平衡态到远离平衡态的噪声,发现1/f噪声与源漏偏置电压(VSD)存在异常的依赖关系。虽然Hooge关系不是在电荷中性点附近的情况下,我们发现,它是恢复在很低的VSD区域。我们认为,在有限的VSD诱导的电子-空穴池的脱钉,这可以解释这种异常的噪声行为。

英文摘要:

We investigate the noise in single layer graphene devices from equilibrium to far from equilibrium and found that the 1/f noise shows an anomalous dependence on the source-drain bias voltage (VSD). While the Hooge relation is not the case around the charge neutrality point, we found that it is recovered at very low VSD region. We propose that the depinning of the electron-hole puddles is induced at finite VSD, which may explain this anomalous noise behavior.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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