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arXiv 1006.1600cond-mat.mes-hall
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化学气相沉积石墨烯中的大低频电阻噪声

Large low-frequency resistance noise in chemical vapor deposited graphene

Atindra Nath Pal, Ageeth A. Bol, Arindam Ghosh

摘要:

我们报告了一个详细的调查,在Si/SiO $_2$衬底上的单层石墨烯薄膜的电阻噪声通过化学气相沉积(CVD)铜箔。我们发现这些系统中的噪声相当大,当用唯象的Hooge方程表示时,它对应的Hooge参数大到$0.1 - 0.5$。我们还发现噪声幅度随栅极电压(或载流子密度)和温度的变化是令人惊讶的弱,这也不同于其他形式的石墨烯中的噪声行为,特别是来自剥离的那些。

英文摘要:

We report a detailed investigation of resistance noise in single layer graphene films on Si/SiO$_2$ substrates obtained by chemical vapor deposition (CVD) on copper foils. We find that noise in these systems to be rather large, and when expressed in the form of phenomenological Hooge equation, it corresponds to Hooge parameter as large as $0.1 - 0.5$. We also find the variation in the noise magnitude with the gate voltage (or carrier density) and temperature to be surprisingly weak, which is also unlike the behavior of noise in other forms of graphene, in particular those from exfoliation.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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