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arXiv 1602.01663cond-mat.mes-hall
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化学气相沉积单层MoS2双极型发光晶体管

Ambipolar Light-Emitting Transistors on Chemical Vapor Deposited Monolayer MoS2

Evgeniy Ponomarev, Ignacio Gutiérrez-Lezama, Nicolas Ubrig, Alberto F. Morpurgo

摘要:

我们实现和研究离子液体栅场效应晶体管(FET)的大面积二硫化钼单层化学气相沉积(CVD)生长。在电子积累下,这些器件的性能与基于剥离薄片的FET的性能相当。然而,CVD生长的材料上的FET表现出明显的双极传输,这对于二硫化钼单层以前没有报道过。我们利用这一特性直接从器件传输曲线估计单层MoS 2的带隙Δ,发现Δ $\approx$为2.4-2.7 eV。在双极注入制度中,我们观察到由于激子复合在二硫化钼的电致发光,起源于该区域接近空穴注入接触。所观察到的输运性质和电致发光的行为都可以一致地理解为由于在价带顶部上方250-300 meV的能量处存在缺陷态,其充当空穴的深陷阱。我们的研究结果具有技术相关性,因为它们表明,具有有用的光电功能的器件可以在通过可控和可扩展技术生产的大面积二硫化钼单层上实现。

英文摘要:

We realize and investigate ionic liquid gated field-effect transistors (FETs) on large-area MoS2 monolayers grown by chemical vapor deposition (CVD). Under electron accumulation, the performance of these devices is comparable to that of FETs based on exfoliated flakes. FETs on CVD-grown material, however, exhibit clear ambipolar transport, which for MoS2 monolayers had not been reported previously. We exploit this property to estimate the bandgap Δ of monolayer MoS2 directly from the device transfer curves and find Δ $\approx$ 2.4-2.7 eV. In the ambipolar injection regime, we observe electroluminescence due to exciton recombination in MoS2, originating from the region close to the hole-injecting contact. Both the observed transport properties and the behavior of the electroluminescence can be consistently understood as due to the presence of defect states at an energy of 250-300 meV above the top of the valence band, acting as deep traps for holes. Our results are of technological relevance, as they show that devices with useful optoelectronic functionality can be realized on large-area MoS2 monolayers produced by controllable and scalable techniques.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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