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arXiv 1502.02878cond-mat.mes-hall
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闪烁噪声对石墨烯辐射热响应的限制

Limits on the Bolometric response of Graphene due to flicker noise

Sameer Grover, Sudipta Dubey, John P. Mathew, Mandar M. Deshmukh

摘要:

利用扫描光电流显微镜研究了石墨烯场效应晶体管在近场和远场配置下的光响应,发现石墨烯在远离接触的源漏偏置电压下的响应主要是由激光诱导加热引起的测辐射热效应决定的.我们发现,在光调制频率高达100 kHz的光电流没有显着的变化。虽然测辐射热电流的大小与偏置电压成比例,但它也会导致噪声。这种噪声的频率依赖性表明,它具有1/f特性,与偏置电压成比例,并限制在低光功率下可检测的热辐射光响应。

英文摘要:

We study the photoresponse of graphene field effect transistors using scanning photocurrent microscopy in near and far field configurations, and we find that the response of graphene under a source-drain bias voltage away from the contacts is dominated by the bolometric effect caused by laser induced heating. We find no significant change in the photocurrent with the optical modulation frequency upto 100 kHz. Although the magnitude of the bolometric current scales with bias voltage, it also results in noise. The frequency dependence of this noise indicates that it has a 1/f character, scales with the bias voltage and limits the detectable bolometric photoresponse at low optical powers.

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