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arXiv 0812.3884cond-mat.mtrl-scicond-mat.mes-hall
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双层石墨烯晶体管的闪烁噪声

Flicker Noise in Bilayer Graphene Transistors

Q. Shao, G. Liu, D. Teweldebrhan, A. A. Balandin, S. Roumyantesv, M. Shur, D. Yan

摘要:

本文介绍了双层石墨烯晶体管低频噪声的实验研究结果.背栅器件采用电子束光刻和蒸发工艺制作.所制造的晶体管的电荷中性点约为10 V。在10 - 100 Hz以上的频率处的噪声谱是1/f型的,在1 kHz的频率处的谱密度为10 E-23 - 10 E-22 A2/Hz的量级。在低于10 - 100 Hz的频率处偏离1/f谱表明噪声是由于缺陷俘获载流子而引起的载流子数波动的根源。为此类器械提取了10 E-4的Hooge参数。噪声谱密度的栅极依赖性表明,噪声主要由器件沟道的非门控部分和接触的贡献。所得结果对石墨烯的电子应用具有重要意义。

英文摘要:

We present the results of the experimental investigation of the low - frequency noise in bilayer graphene transistors. The back - gated devices were fabricated using the electron beam lithography and evaporation. The charge neutrality point for the fabricated transistors was around 10 V. The noise spectra at frequencies above 10 - 100 Hz were of the 1/f - type with the spectral density on the order of 10E-23 - 10E-22 A2/Hz at the frequency of 1 kHz. The deviation from the 1/f spectrum at the frequencies below 10 -100 Hz indicates that the noise is of the carrier - number fluctuation origin due to the carrier trapping by defects. The Hooge parameter of 10E-4 was extracted for this type of devices. The gate dependence of the noise spectral density suggests that the noise is dominated by the contributions from the ungated part of the device channel and by the contacts. The obtained results are important for graphene electronic applications.

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